The characterization of the material structure has three main tasks: component analysis, structure determination, and morphology observation. In addition to traditional chemical analysis techniques, chemical composition analysis of materials includes mass spectrometry, ultraviolet, visible, infrared spectroscopy, gas, liquid chromatography, and nuclear magnetic resonance. The characterization of the material structure is still dominated by diffraction methods. The diffraction methods mainly include X-ray diffraction, electron diffraction, neutron diffraction, Musberg spectrum, γ-ray diffraction, and the like. Morphology observation mainly relies on the microscope, which is a popular method for observing materials on the micrometer scale. Scanning electron microscopy and transmission electron microscopy advance the observed dimensions to sub-micron and sub-micron levels.
Below is a list of our Structure Characterization Technique (include but not limited to the following):
Scanning electron microscopy (SEM) is a microscopic morphology observation method between transmission electron microscope and optical microscope. It can directly use the material properties of the sample surface material for microscopic imaging.
AFM is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer. The information is gathered by “feeling” or “touching” the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning.
FTIR is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid or gas. An FTIR spectrometer simultaneously collects high-spectral-resolution data over a wide spectral range. This confers a significant advantage over a dispersive spectrometer, which measures intensity over a narrow range of wavelengths at a time.
This technique includes Debye powder photographic analysis, high temperature, normal temperature, low-temperature diffractometer, back reflection, and transmission Laue photography, quadruple diffractometer for measuring single crystal structure, and the like. By X-ray diffraction of the material, the diffraction pattern is analyzed to obtain information on the composition of the material, the structure or morphology of the atoms or molecules inside the material. Used to determine the atomic and molecular structure of a crystal.
XPS uses X-rays to radiate a sample, causing the inner or electrons of an atom or molecule to be excited to emit. XPS is widely used to analyze inorganic compounds, alloys, semiconductors, polymers, elements, catalysts, glass, ceramics, dyes, paper, ink, wood, cosmetics, teeth, bones, implants, biomaterials, greases, glues, and the like.
BOC Sciences can provide structure characterization with high quality and short period. Our experts and analysts have rich experience and intimate knowledge of analytical process. We are glad to hear from you!