X-Ray Powder Diffraction

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X-Ray Powder Diffraction

X-ray powder diffraction (XRPD) is one of the most common forms of XRD. XRD, that is, X-ray diffraction, refers to a method of analyzing the diffraction pattern of material by X-ray diffraction to obtain information on the composition of the material, the structure or morphology of atoms or molecules inside the material. It is primarily used to determine the atomic and molecular structure of a crystal, the principle being that the crystal structure causes the incident X-ray beam to diffract into many specific directions. By measuring the angle and intensity of these diffracted beams, a three-dimensional image of the electron density within the crystal can be produced. Based on this electron density, the average position of the atoms in the crystal, as well as their chemical bonds and various other information, can be determined. The X-ray diffractometer can be classified into an X-ray powder diffractometer (XRPD) and an X-ray single crystal diffractometer (SC-XRD). It is difficult to form relatively large single crystal particles. Therefore, the current X-ray powder diffraction technology is the mainstream X-ray diffraction analysis technology.

XRPD applications:

  • Phase composition, grain size and shape, lattice distortion and fault, composition change, orientation, in-situ structure development
  • Catalyst assessment
  • Fuel quality testing
  • Research and development of new materials
  • Polymers and composites
  • Pharmaceuticals and organics
  • Nanomaterials
  • Precipitates and scales in plant pipelines and pipelines
  • Finely ground product
  • Combined with other professional will have more extensive use

Below is a list of our X-Ray Powder Diffraction Services (include but not limited to the following):

  • Identification of fine-grain minerals such as clays and mixed-layer clays, which are difficult to optically measure
  • Measurement of sample purity
  • Quantitative calculation of the mixture of the quality of the ratio
  • Determining the crystal form of the substance
  • Determining whether the substance is a crystal
  • Determining what kind of crystal material
  • Determining lattice mismatch between film and substrate
  • Measuring the stress of the material structure
  • Measuring super-lattices in multilayer epitaxial structures
  • Determining film thickness, roughness and density
  • Texture measurement in polycrystalline samples, such as grain orientation

Why Choose BOC Sciences?

BOC Sciences analytical labs is able to perform various types of chemical analysis and we are committed to providing realistic turnaround time and increased competitiveness. Our entire staff, among who are the most respected and knowledgeable in this field, are ready to help solve your questions, meet your most demanding analytical needs. XRPD analysts keep the customer’s needs in mind while formulating standardized procedures. However, if the service you need is not listed, welcome to contact the laboratory and we can arrange a tailored analysis program to meet your needs.

References

  1. Das, U. , Naskar, J. , & Mukherjee, A. K. . (2015). Conformational analysis of an acyclic tetrapeptide:\r, ab-initio\r, structure determination from x-ray powder diffraction, hirshfeld surface analysis and electronic structure. Journal of Peptide Science, 21(12), 845-852.
  2. Storm, M. M. , Johnsen, R. E. , & Norby, P. . (2016). In situ x-ray powder diffraction studies of the synthesis of graphene oxide and formation of reduced graphene oxide. Journal of Solid State Chemistry, 240, 49-54.
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